Pin Defect Inspection with X-ray Images.
Journal
Advances in Neural Networks - ISNN 2017 - 14th International Symposium, ISNN 2017, Sapporo, Hakodate, and Muroran, Hokkaido, Japan, June 21-26, 2017, Proceedings, Part II
Pages
465-473
Date Issued
2017
Author(s)
SDGs
Type
conference paper
