Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Adaptive tilting angles to achieve high-precision scanning of a dual probes AFM
Details
Adaptive tilting angles to achieve high-precision scanning of a dual probes AFM
Journal
Asian Journal of Control
Journal Volume
20
Journal Issue
4
Pages
1339-1351
Date Issued
2018
Author(s)
Wu, J.-W.
Lo, Y.-T.
Liu, W.-C.
Liu, D.-W.
Chang, K.-Y.
LI-CHEN FU
DOI
10.1002/asjc.1881
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/488889
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85050565893&doi=10.1002%2fasjc.1881&partnerID=40&md5=553015bf3126f48decae5daae72fb301
SDGs
[SDGs]SDG7
Type
journal article