PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices.

Journal

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015

Pages

1209-1212

Date Issued

2015

Author(s)

Chen, Fu-Hsin

Yang, Ming-Chang

Chang, Yuan-Hao

URI

URL

Type

conference paper