Reducing test point overhead with don't-cares

Journal

Midwest Symposium on Circuits and Systems

Pages

534-537

Date Issued

2012

Author(s)

Chang, K.-H.

Chang, C.-W.

Jiang, J.-H.R.

Liu, C.-N.J.

DOI

10.1109/MWSCAS.2012.6292075

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497790

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867299600&doi=10.1109%2fMWSCAS.2012.6292075&partnerID=40&md5=23a7f0091766aa2f7bca91ccdfe540eb

Type

conference paper