https://scholars.lib.ntu.edu.tw/handle/123456789/497790| Title: | Reducing test point overhead with don't-cares | Authors: | Chang, K.-H. Chang, C.-W. Jiang, J.-H.R. Liu, C.-N.J. JIE-HONG JIANG |
Issue Date: | 2012 | Start page/Pages: | 534-537 | Source: | Midwest Symposium on Circuits and Systems | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/497790 | DOI: | 10.1109/MWSCAS.2012.6292075 |
| Appears in Collections: | 電機工程學系 |
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