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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Reducing test point overhead with don't-cares
Details
Reducing test point overhead with don't-cares
Journal
Midwest Symposium on Circuits and Systems
Pages
534-537
Date Issued
2012
Author(s)
Chang, K.-H.
Chang, C.-W.
Jiang, J.-H.R.
Liu, C.-N.J.
JIE-HONG JIANG
DOI
10.1109/MWSCAS.2012.6292075
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/497790
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867299600&doi=10.1109%2fMWSCAS.2012.6292075&partnerID=40&md5=23a7f0091766aa2f7bca91ccdfe540eb
Type
conference paper