https://scholars.lib.ntu.edu.tw/handle/123456789/497934| Title: | Optimal wiring topology for electromigration avoidance considering multiple layers and obstacles | Authors: | Jiang, I.H.-R. Chang, H.-Y. Chang, C.-L. HUI-RU JIANG |
Issue Date: | 2010 | Start page/Pages: | 177-184 | Source: | Proceedings of the International Symposium on Physical Design | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/497934 | DOI: | 10.1145/1735023.1735064 |
| Appears in Collections: | 電機工程學系 |
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