https://scholars.lib.ntu.edu.tw/handle/123456789/498012
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Liu, Y.-H. | en_US |
dc.contributor.author | Kao, C.-H. | en_US |
dc.contributor.author | Cheng, T.-C. | en_US |
dc.contributor.author | Wu, C.-I. | en_US |
dc.contributor.author | Wang, J.-C. | en_US |
dc.contributor.author | CHIH-I WU | en_US |
dc.date.accessioned | 2020-06-11T06:14:33Z | - |
dc.date.available | 2020-06-11T06:14:33Z | - |
dc.date.issued | 2017 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/498012 | - |
dc.relation.ispartof | Nanomaterials | - |
dc.title | Data retention characterization of gate-injected gold-nanoparticle non-volatile memory with low-damage CF <inf>4</inf> -plasma-treated blocking oxide layer | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.3390/nano7110385 | - |
dc.identifier.scopus | 2-s2.0-85034430228 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85034430228&doi=10.3390%2fnano7110385&partnerID=40&md5=618c2f592c82b79877fb8682c8821fd8 | - |
dc.relation.journalvolume | 7 | - |
dc.relation.journalissue | 11 | - |
item.fulltext | no fulltext | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Photonics and Optoelectronics | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.orcid | 0000-0003-3613-7511 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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