A build-in self-test technique for RF low-noise amplifiers
Journal
IEEE Transactions on Microwave Theory and Techniques
Journal Volume
56
Journal Issue
5
Pages
1035-1042
Date Issued
2008
Author(s)
Abstract
A built-in self-test (BIST) technique suitable for RF low-noise amplifiers (LNAs) is presented in this paper. With fully integrated amplitude detectors and logarithmic amplifiers, the BIST module can be employed as a generic platform for gain extraction of the device-under-test (DUT) without expensive testing instruments, while maintaining a reasonable hardware overhead and minimum loading effects to the DUT. Using a 0.18-μ m CMOS process, a 5-GHz variable-gain LNA with the proposed BIST module is implemented. Based on the experimental results, on-chip gain extraction of the LNA has been demonstrated with an error less than 1 dB for various gain modes. The additional chip area required for the BIST functionality measures 0.042 mm2, which is considerably small compared with the physical size of the RF amplifiers. © 2006 IEEE.
Subjects
Amplitude detectors; Built-in self-test (BIST); Logarithmic amplifiers; Low-noise amplifiers (LNAs); RF testing
SDGs
Other Subjects
CMOS integrated circuits; Computer hardware; Gain control; Logarithmic amplifiers; Low noise amplifiers; Amplitude detectors; Device-under-test (DUT); RF testing; Built-in self test
Type
journal article