A BIST technique for RF voltage-controlled oscillators

Journal

Proceedings of the Asian Test Symposium

Pages

143-146

Date Issued

2007

Author(s)

Hsieh, H.-H.

Huang, Y.-C.

Lu, L.-H.

Huang, G.-W.

DOI

10.1109/ATS.2007.4388000

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/498209

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-48049110069&doi=10.1109%2fATS.2007.4388000&partnerID=40&md5=a71ff56c129b720afce33d6151c8554c

Type

conference paper