Stress effects on self-aligned silicon nanowire junctionless field-effect transistors

Journal

IEEE Electron Device Letters

Journal Volume

32

Journal Issue

9

Pages

1194-1196

Date Issued

2011

Author(s)

Huang, C.J.

Yang, C.H.

Hsueh, C.Y.

Lee, J.H.

Chang, Y.T.

DOI

10.1109/LED.2011.2159772

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/498840

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-80052030092&doi=10.1109%2fLED.2011.2159772&partnerID=40&md5=7c08ca883daabe15473cd10b1a884718

Type

journal article