Effect of rapid thermal annealing on carrier lifetimes of arsenic-ion-implanted GaAs

Journal

Applied Physics Letters

Journal Volume

69

Journal Issue

7

Pages

996-998

Date Issued

1996

Author(s)

Lin, G.-R.

Chen, W.-C.

Ganikhanov, F.

Chang, C.-S.

Pan, C.-L.

DOI

10.1063/1.117107

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500215

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0000173763&doi=10.1063%2f1.117107&partnerID=40&md5=cacc07cb7101f11e5751a17ca6cf6db6

Type

journal article