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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Effect of Focused Ion Beam Imaging on the Crystallinity of InAs
Details
Effect of Focused Ion Beam Imaging on the Crystallinity of InAs
Journal
Microscopy and Microanalysis
Journal Volume
21
Journal Issue
6
Pages
1426-1432
Date Issued
2015
Author(s)
Chen, W.-C.
Huang, T.-H.
Chen, K.-C.
HAO-HSIUNG LIN
DOI
10.1017/S1431927615015159
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/500397
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84994613533&doi=10.1017%2fS1431927615015159&partnerID=40&md5=772a93d63a1b5730cea25b8305961c7c
Type
journal article