Study of InAlAs/InGaAs heterojunction bipolar transistor layers by optically detected cyclotron resonance

Journal

Applied Physics Letters

Journal Volume

66

Journal Issue

19

Pages

2543-2545

Date Issued

1995

Author(s)

Chen, Y.F.

Shen, J.L.

Dai, Y.D.

Jan, G.J.

DOI

10.1063/1.113161

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500403

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-36448998683&doi=10.1063%2f1.113161&partnerID=40&md5=6d6ab7b8e3d6aa1e657c1ad3ffd48e98

Type

journal article