Fault diagnosis in reconfigurable VLSI and WSI processor arrays.

Journal

VLSI Signal Processing

Journal Volume

2

Journal Issue

3

Pages

173-187

Date Issued

1990

Author(s)

Kuo, Sy-Yen

Wang, Kuochen

DOI

10.1007/BF00935214

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500843

URL

https://doi.org/10.1007/BF00935214

Type

journal article