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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Pattern overlap implies runaway growth in hierarchical tile systems.
Details
Pattern overlap implies runaway growth in hierarchical tile systems.
Journal
JoCG
Journal Volume
7
Journal Issue
2
Pages
3-18
Date Issued
2016
Author(s)
Doty, David
Chen, Ho-Lin
Manuch, J?n
Rafiey, Arash
Stacho, Ladislav
CHEN HO-LIN
DOI
10.20382/jocg.v7i2a2
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501222
URL
https://doi.org/10.20382/jocg.v7i2a2
Type
journal article