https://scholars.lib.ntu.edu.tw/handle/123456789/501352
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, H.-M. | en_US |
dc.contributor.author | Cheng, K.-T. | en_US |
dc.contributor.author | JIUN-LANG HUANG | en_US |
dc.creator | Chang, H.-M.;Cheng, K.-T.;Huang, J.-L. | - |
dc.date.accessioned | 2020-06-11T06:50:39Z | - |
dc.date.available | 2020-06-11T06:50:39Z | - |
dc.date.issued | 2011 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/501352 | - |
dc.relation.ispartof | Proceedings - 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2011 | - |
dc.title | Image-quality-driven metrics for testing and calibrating ADC array in CMOS imagers: A first step | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/IMS3TW.2011.13 | - |
dc.identifier.scopus | 2-s2.0-84863127767 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84863127767&doi=10.1109%2fIMS3TW.2011.13&partnerID=40&md5=def2a39b14ec5767e80466cd424303e2 | - |
dc.relation.pages | 29-32 | - |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.grantfulltext | none | - |
item.openairetype | conference paper | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Integrated Circuit Design and Automation | - |
crisitem.author.orcid | 0000-0002-9425-3855 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電機工程學系 |
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