Analysis on the temperature dependent characteristics of SiGe HBTs
Journal
2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings
Pages
178-179
Date Issued
2003
Author(s)
Liang, C.-S.
Pei, Z.
Hsu, Y.-M.
Pan, T.-M.
Liu, Y.-H.
Liu, C.W.
Lu, S.C.
Hsieh, W.-Y.
Tsai, M.-J.
SDGs
Type
conference paper