A two-level simultaneous test data and time reduction technique for SOC

Journal

Journal of Information Science and Engineering

Journal Volume

24

Journal Issue

3

Pages

841-857

Date Issued

2008

Author(s)

Liaw, Y.-T.

Bai, B.-C.

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505960

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-44649096324&partnerID=40&md5=4de2a3fc2299d9f7346234453f060739

Type

journal article