Physical-aware diagnosis of multiple interconnect defects

Journal

ITC-Asia 2017 - International Test Conference in Asia

Pages

40-45

Date Issued

2017

Author(s)

Chen, P.-H.

Lee, C.-L.

Chen, J.-Y.

Chen, P.-W.

DOI

10.1109/ITC-ASIA.2017.8097108

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/505973

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85040616670&doi=10.1109%2fITC-ASIA.2017.8097108&partnerID=40&md5=7d19060b035e65b875a159862807cb24

Type

conference paper