https://scholars.lib.ntu.edu.tw/handle/123456789/505984| Title: | Robust test pattern generation for hold-time faults in nanometer technologies | Authors: | Ho, Y.-H. Chen, Y.-W. Chang, C.-M. Yang, K.-C. Li, J.C.-M. CHIEN-MO LI |
Issue Date: | 2017 | Source: | 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/505984 | DOI: | 10.1109/VLSI-DAT.2017.7939647 |
| Appears in Collections: | 電機工程學系 |
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