https://scholars.lib.ntu.edu.tw/handle/123456789/505985| Title: | Parallel order ATPG for test compaction | Authors: | Chen, Y.-W. Ho, Y.-H. Chang, C.-M. Yang, K.-C. Li, M.-T. Li, J.C.-M. CHIEN-MO LI |
Issue Date: | 2018 | Start page/Pages: | 1月4日 | Source: | 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/505985 | DOI: | 10.1109/VLSI-DAT.2018.8373264 |
| Appears in Collections: | 電機工程學系 |
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