https://scholars.lib.ntu.edu.tw/handle/123456789/505993
Title: | Automatic test pattern generation | Authors: | Cheng, K.-T.T. Wang, L.-C. Li, H. CHIEN-MO LI |
Issue Date: | 2017 | Start page/Pages: | 559-604 | Source: | Electronic Design Automation for IC System Design, Verification, and Testing | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/505993 | DOI: | 10.1201/b19569 |
Appears in Collections: | 電機工程學系 |
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