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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier
Details
Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier
Journal
IEEE Journal of the Electron Devices Society
Journal Volume
5
Pages
107-111
Date Issued
2017
Author(s)
V. P.-H. Hu
VITA PI-HO HU
V. P.-H. Hu
胡璧合
DOI
10.1109/jeds.2016.2644724
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/516587
Type
journal article