https://scholars.lib.ntu.edu.tw/handle/123456789/516587| Title: | Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier | Authors: | V. P.-H. Hu VITA PI-HO HU V. P.-H. Hu 胡璧合 VITA PI-HO HU |
Issue Date: | 2017 | Journal Volume: | 5 | Start page/Pages: | 107-111 | Source: | IEEE Journal of the Electron Devices Society | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516587 | DOI: | 10.1109/jeds.2016.2644724 |
| Appears in Collections: | 電機工程學系 |
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