https://scholars.lib.ntu.edu.tw/handle/123456789/516589| Title: | Analysis of GeOI FinFET 6T SRAM Cells With Variation-Tolerant WLUD Read-Assist and TVC Write-Assist | Authors: | V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang VITA PI-HO HU V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang 胡璧合 VITA PI-HO HU |
Issue Date: | 2015 | Journal Volume: | 62 | Start page/Pages: | 1710-1715 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516589 | DOI: | 10.1109/ted.2015.2412973 |
| Appears in Collections: | 電機工程學系 |
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