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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET
Details
Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET
Journal
IEEE Journal of the Electron Devices Society
Journal Volume
3
Pages
194-199
Date Issued
2015
Author(s)
C.-W. Hsu
M.-L. Fan
V. P.-H. Hu
Pin Su
VITA PI-HO HU
C.-W. Hsu
M.-L. Fan
V. P.-H. Hu
Pin Su
胡璧合
DOI
10.1109/jeds.2015.2408356
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/516590
Type
journal article