Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET

Journal

IEEE Journal of the Electron Devices Society

Journal Volume

3

Pages

194-199

Date Issued

2015

Author(s)

C.-W. Hsu

M.-L. Fan

V. P.-H. Hu

Pin Su

C.-W. Hsu

M.-L. Fan

V. P.-H. Hu

Pin Su

DOI

10.1109/jeds.2015.2408356

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/516590

Type

journal article