https://scholars.lib.ntu.edu.tw/handle/123456789/516591| Title: | Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits | Authors: | Y.-N. Chen C.-J. Chen M.-L. Fan V. P.-H. Hu Pin Su C.-T. Chuang VITA PI-HO HU Y.-N. Chen C.-J. Chen M.-L. Fan V. P.-H. Hu Pin Su C.-T. Chuang 胡璧合 VITA PI-HO HU |
Issue Date: | 2015 | Journal Volume: | 5 | Start page/Pages: | 101-115 | Source: | Journal of Low Power Electronics and Applications | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516591 | DOI: | 10.3390/jlpea5020101 |
| Appears in Collections: | 電機工程學系 |
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