Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET
Journal
IEEE Transactions on Electron Devices
Journal Volume
62
Pages
107-113
Date Issued
2015
Author(s)
M.-L. Fan
V. P.-H. Hu
Y.-N. Chen
C.-W. Hsu
Pin Su
C.-T. Chuang
M.-L. Fan
V. P.-H. Hu
Y.-N. Chen
C.-W. Hsu
Pin Su
C.-T. Chuang
Type
journal article