https://scholars.lib.ntu.edu.tw/handle/123456789/516599| Title: | Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET | Authors: | M.-L. Fan V. P.-H. Hu Y.-N. Chen P. Su C.-T. Chuang VITA PI-HO HU M.-L. Fan V. P.-H. Hu Y.-N. Chen P. Su C.-T. Chuang 胡璧合 VITA PI-HO HU |
Issue Date: | 2013 | Journal Volume: | 60 | Start page/Pages: | 2038-2044 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516599 | DOI: | 10.1109/ted.2013.2258157 |
| Appears in Collections: | 電機工程學系 |
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