Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET
Journal
IEEE Transactions on Electron Devices
Journal Volume
60
Pages
2038-2044
Date Issued
2013
Author(s)
M.-L. Fan
V. P.-H. Hu
Y.-N. Chen
P. Su
C.-T. Chuang
M.-L. Fan
V. P.-H. Hu
Y.-N. Chen
P. Su
C.-T. Chuang
Type
journal article