Design and Analysis of Robust Tunneling FET SRAM
Journal
IEEE Transactions on Electron Devices
Journal Volume
60
Pages
1092-1098
Date Issued
2013
Author(s)
Y.-N. Chen
M.-L. Fan
V. P.-H. Hu
P. Su
C.-T. Chuang
Y.-N. Chen
M.-L. Fan
V. P.-H. Hu
P. Su
C.-T. Chuang
Type
journal article