https://scholars.lib.ntu.edu.tw/handle/123456789/516604
標題: | Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs | 作者: | C.-H. Yu Y.-S. Wu P. Su VITA PI-HO HU |
關鍵字: | Backgate bias; germanium-on-insulator (GeOI); quantum confinement (QC); ultra-thin body (UTB) | 公開日期: | 2012 | 卷: | 59 | 期: | 7 | 起(迄)頁: | 1851-1855 | 來源出版物: | IEEE Transactions on Electron Devices | 摘要: | This paper investigates the impact of quantum confinement (QC) on the backgate-bias (V bg) modulated subthreshold and threshold-voltage (V th) characteristics of ultra-thin-body germanium-on-insulator (UTB GeOI) MOSFETs using an analytical solution of the Schrdinger equation verified with TCAD numerical simulation. Our study indicates that the QC effect reduces the sensitivity of the subthreshold swing to V bg. In addition, the sensitivity of V th to V bg can be enhanced by the QC effect particularly for electrostatically well-behaved UTB MOSFETs with triangular potential well. Aside from that, the sensitivity of V th roll-off to V bg is reduced by the QC effect. Since Ge and Si channels exhibit different degrees of QC due to different quantization effective mass, the impact of QC has to be considered when one-to-one comparisons between GeOI and SOI MOSFETs regarding the backgate-bias modulated threshold-voltage and subthreshold characteristics are made. Our study may provide insights for multi-V th device/circuit designs using advanced UTB GeOI technologies. © 2012 IEEE. |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516604 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84862657222&doi=10.1109%2fTED.2012.2194499&partnerID=40&md5=d57d854337e13914531879a327f75d85 |
ISSN: | 00189383 | DOI: | 10.1109/ted.2012.2194499 | SDG/關鍵字: | Back-gate bias; Effective mass; Germanium-on-insulator; MOSFETs; Potential wells; Schrdinger equations; SOI-MOSFETs; Subthreshold; Subthreshold characteristics; Subthreshold swing; Ultrathin body; Design; Germanium; Quantum confinement; Threshold voltage; MOSFET devices |
顯示於: | 電機工程學系 |
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