https://scholars.lib.ntu.edu.tw/handle/123456789/516608| Title: | Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity | Authors: | V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang VITA PI-HO HU V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang 胡璧合 VITA PI-HO HU |
Issue Date: | 2011 | Journal Volume: | 1 | Start page/Pages: | 335-342 | Source: | IEEE Journal on Emerging and Selected Topics in Circuits and Systems | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516608 | DOI: | 10.1109/jetcas.2011.2163691 |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
