https://scholars.lib.ntu.edu.tw/handle/123456789/516609| Title: | FinFET SRAM Cell Optimization Considering Temporal Variability Due to NBTI/PBTI, Surface Orientation and Various Gate Dielectrics | Authors: | V. P.-H. Hu M.-L. Fan C.-Y. Hsieh P. Su C.-T. Chuang VITA PI-HO HU V. P.-H. Hu M.-L. Fan C.-Y. Hsieh P. Su C.-T. Chuang 胡璧合 VITA PI-HO HU |
Issue Date: | 2011 | Journal Volume: | 58 | Start page/Pages: | 805-811 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516609 | DOI: | 10.1109/ted.2010.2099661 |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.