https://scholars.lib.ntu.edu.tw/handle/123456789/559023| Title: | Transient Two-State Characteristics in MIS(p) Tunnel Diode with Edge-Thickened Oxide (ETO) Structure | Authors: | Yang, Y.-C. Lin, K.-W. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2020 | Journal Volume: | 9 | Journal Issue: | 10 | Source: | ECS Journal of Solid State Science and Technology | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85095765654&partnerID=40&md5=7f4cfc87098023f5a3944a95ae36ac88 https://scholars.lib.ntu.edu.tw/handle/123456789/559023 |
DOI: | 10.1149/2162-8777/abc576 |
| Appears in Collections: | 電機工程學系 |
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