https://scholars.lib.ntu.edu.tw/handle/123456789/559024| Title: | Prolonged Transient Behavior of Ultrathin Oxide MIS-Tunneling Diode Induced by Deep Depletion of Surrounded Coupling Electrode | Authors: | Hsu, T.-H. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2020 | Journal Volume: | 67 | Journal Issue: | 8 | Start page/Pages: | 3411-3416 | Source: | IEEE Transactions on Electron Devices | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85090274971&partnerID=40&md5=aa8784a221896ca1daab055f541861db https://scholars.lib.ntu.edu.tw/handle/123456789/559024 |
DOI: | 10.1109/TED.2020.2998099 |
| Appears in Collections: | 電機工程學系 |
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