https://scholars.lib.ntu.edu.tw/handle/123456789/559026| Title: | Gate Oxide Local Thinning Mechanism-Induced Sub-60 mV/Decade Subthreshold Swing on Charge-Coupled MIS(p) Tunnel Transistor | Authors: | Yang, C.-F. Chen, B.-J. Chen, W.-C. Lin, K.-W. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2019 | Journal Volume: | 66 | Journal Issue: | 1 | Start page/Pages: | 279-285 | Source: | IEEE Transactions on Electron Devices | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85057188985&partnerID=40&md5=69a3bc575b25bab107f52d3af9890a88 https://scholars.lib.ntu.edu.tw/handle/123456789/559026 |
DOI: | 10.1109/TED.2018.2879654 |
| Appears in Collections: | 電機工程學系 |
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