https://scholars.lib.ntu.edu.tw/handle/123456789/559116
Title: | A New Fitting Method for Ambipolar Diffusion Length Extraction in Thin Film Structures Using Photoluminescence Measurement with Scanning Excitation | Authors: | Chu, C.-H. Mao, M.-H. Lin, Y.-R. MING-HUA MAO HAO-HSIUNG LIN |
Issue Date: | 2020 | Journal Volume: | 10 | Journal Issue: | 1 | Source: | Scientific Reports | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85082538621&partnerID=40&md5=d88660416c6fde8bf73fd3f04415affa https://scholars.lib.ntu.edu.tw/handle/123456789/559116 |
DOI: | 10.1038/s41598-020-62093-w |
Appears in Collections: | 電機工程學系 |
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