https://scholars.lib.ntu.edu.tw/handle/123456789/576948
標題: | Deposition of (111)-oriented Ag nano-twinned film on (111) Si wafer | 作者: | Wu P.-C Lee P.-I Lai Y.-C Lin Y.-C Chuang T.-H. TUNG-HAN CHUANG |
公開日期: | 2020 | 起(迄)頁: | 1-7 | 來源出版物: | Proceedings of the World Congress on Mechanical, Chemical, and Material Engineering | 摘要: | The special coincidence twin boundary has many advantageous effects for structural and electronic materials. In this study, nano-twinned Ag films with a strong (111) preferred orientation were sputtered on (111) Si substrates with and without a Ti adhesive layer. The proportion of Σ3 twin boundaries to the total grain boundaries was 47.2%. The addition of a Ti adhesive layer with a thickness of 0.1 μm can effectively reduce the peeling failure of nano-twinned Ag film on (111) Si substrate. ? 2020, Avestia Publishing. All rights reserved. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85097431826&doi=10.11159%2fmmme20.109&partnerID=40&md5=40a99b60eadb488c2d5422bedd5e73b5 https://scholars.lib.ntu.edu.tw/handle/123456789/576948 |
ISSN: | 23698136 | DOI: | 10.11159/mmme20.109 |
顯示於: | 材料科學與工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。