|Title:||QATG: Automatic Test Generation for Quantum Circuits||Authors:||Wu C.-H
|Keywords:||Gradient methods; Automatic test generation; Fault coverages; Gradient descent; Quantum circuit; Quantum gates; Test configurations; Test generations; Test lengths; Timing circuits||Issue Date:||2020||Journal Volume:||2020-November||Source:||Proceedings - International Test Conference||Abstract:||
Researchers now use randomized benchmarking or quantum volume to test quantum circuits (QC) in the laboratory. However, these tests are long and their fault coverage is unclear. In this paper, we propose behavior fault models based on the function of quantum gates. These fault models are scalable because the number of faults is polynomial, not exponential, to the size of QC. We propose a novel test generation that uses gradient descent to generate test configuration with short length. We revise the chi-square statistical method to decide the number of test repetitions under the specified test escape and overkill. Experimental results on IBM Q systems show that our generated test configurations are effective, and our test lengths are 1,000X shorter than traditional test methods. ? 2020 IEEE.
|Appears in Collections:||電機工程學系|
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