Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
Efficaciously modeling the exterior electrostatic problems with singularity for electron devices
Details
Efficaciously modeling the exterior electrostatic problems with singularity for electron devices
Journal
IEEE, Circuits and devices magazine
Pages
25-34
Date Issued
2004
Author(s)
Y.S. Liao
S.W. Chyuan
J.T. Chen
YUNN-SHIUAN LIAO
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/589588
Type
journal article