https://scholars.lib.ntu.edu.tw/handle/123456789/589588| Title: | Efficaciously modeling the exterior electrostatic problems with singularity for electron devices | Authors: | Y.S. Liao S.W. Chyuan J.T. Chen YUNN-SHIUAN LIAO |
Issue Date: | 2004 | Start page/Pages: | 25-34 | Source: | IEEE, Circuits and devices magazine | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/589588 |
| Appears in Collections: | 機械工程學系 |
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