https://scholars.lib.ntu.edu.tw/handle/123456789/606999
標題: | High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes | 作者: | Huang Y.-M Liou Y.-H Liu A.-C CHIEN-CHUNG LIN Kuo H.-C. |
關鍵字: | Atomic layer deposition;Color;Ink jet printing;Light;Organic light emitting diodes (OLED);Passivation;Temperature;ALD technology;Atomic-layer deposition;Color-light-emitting;Full color;Ink-jet printing;Lightemitting diode;Lows-temperatures;Monolithic chip;Printing techniques;Reliability test;Semiconductor quantum dots | 公開日期: | 2021 | 來源出版物: | 2021 Conference on Lasers and Electro-Optics, CLEO 2021 - Proceedings | 摘要: | We report a 3-in-1 mini-light emitting diode and combine ink-jet printing technique to achieve a full color in monolithic chip. Finally, make reliability test by low-temperature ALD technology at 2020 color gamut of red and green QDs during 300 hours reliability test under 50°C /50% RH condition. ? 2021 OSA. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85120451820&partnerID=40&md5=483686058b07ce94a2ca2d06309298d9 https://scholars.lib.ntu.edu.tw/handle/123456789/606999 |
顯示於: | 電機工程學系 |
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