High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes
Journal
Optics InfoBase Conference Papers
Date Issued
2021
Author(s)
Abstract
We report a 3-in-1 mini-light emitting diode and combine ink-jet printing technique to achieve a full color in monolithic chip. Finally, make reliability test by low-temperature ALD technology at 2020 color gamut of red and green QDs during 300 hours reliability test under 50℃/50% RH condition. ? OSA 2021, ? 2021 The Author(s)
Subjects
Atomic layer deposition
Color
Ink jet printing
Organic light emitting diodes (OLED)
Passivation
Temperature
ALD technology
Atomic-layer deposition
Color-light-emitting
Full color
Ink-jet printing
Lightemitting diode
Lows-temperatures
Monolithic chip
Printing techniques
Reliability test
Semiconductor quantum dots
Type
conference paper