|Title:||The development of an automatic scanning path generation method for the spinneret test||Authors:||Chen C.-J.
|Keywords:||Automatic inspection system;Automatic optical inspection;Automatic scanning;Clearance ratio;Inspection system;Linear stages;Scanning path;scanning path generation;spinneret;Cameras;CCD cameras;Imaging systems;Inspection;Inspection equipment;Light sources;Optical data processing;Optical testing;Scanning||Issue Date:||2010||Journal Volume:||7798||Source:||Proceedings of SPIE - The International Society for Optical Engineering||Abstract:||
An automatic scanning path generation method is developed. The method is based on a 3-axis automatic inspection system which is used to detect the clearance ratio of spinneret plate. The user can rely on this method to automatically generate the scanning path for an unknown spinneret plate in the spinneret test. Then the scanning path can be learned by the inspection system and repeated it for other the same spinneret. Two type spinnerets are introduced in this paper to describe the automatic scanning path generation method. In this paper, the 3-axis automatic inspection system includes a 3-axes motorized linear stage, a telcentric lens, a top light source, a bottom light source, 1 CCD camera and a controlled PC. ? 2010 Copyright SPIE - The International Society for Optical Engineering.
|Appears in Collections:||機械工程學系|
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