Measurement of Lattice Distortion in NbTaTiV and NbTaTiVZr Using Electron Microscopy
Journal
Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Journal Volume
52
Journal Issue
6
Pages
2094-2099
Date Issued
2021
Author(s)
Chou Y.; Lee C.; Liaw P.K.; Chou Y.-C.
DOI
MMTAE
Abstract
High annular angle dark field-scanning transmission electron microscopy (HAADF-STEM) was used to directly measure the lattice distortion of NbTaTiV and NbTaTiVZr by fitting the images with a two-dimensional (2-D) Gauss function. The effect of the scanning direction and the accuracy of the HAADF-STEM method were discussed, and the lattice distortion factors in NbTaTiV and NbTaTiVZr were 0.113 and 0.155 Å, respectively. © 2021, The Minerals, Metals & Materials Society and ASM International.
Subjects
High resolution transmission electron microscopy; Niobium alloys; Niobium metallography; Scanning electron microscopy; Tantalum alloys; Titanium alloys; Titanium metallography; Vanadium alloys; Vanadium metallography; Zircaloy; Zirconium metallography; Dark field; Gauss function; HAADF-STEM; Lattice distortions; Scanning transmission electron microscopy; Two Dimensional (2 D); Tantalum metallography
Publisher
Springer
Type
journal article