https://scholars.lib.ntu.edu.tw/handle/123456789/630398
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, Shi Tang | en_US |
dc.contributor.author | Chen, Jia Xian | en_US |
dc.contributor.author | Wu, Yu Tsung | en_US |
dc.contributor.author | Hsieh, Chao Ho | en_US |
dc.contributor.author | CHIEN-MO LI | en_US |
dc.contributor.author | Chang, Norman | en_US |
dc.contributor.author | Li, Ying Shiun | en_US |
dc.contributor.author | Chuang, Wen Tze | en_US |
dc.date.accessioned | 2023-04-20T10:24:12Z | - |
dc.date.available | 2023-04-20T10:24:12Z | - |
dc.date.issued | 2022-01-01 | - |
dc.identifier.isbn | 9781665494663 | - |
dc.identifier.issn | 19483287 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/630398 | - |
dc.description.abstract | IR-drop becomes an important issue for testing in advanced technology nodes. In this paper, we propose a low-IR-drop test pattern regeneration to produce IR-drop-safe patterns. To speed up IR-drop analysis, we apply an existing machine learning model to predict IR-drop of test patterns. Because we already know the IR-drop of test patterns, we learn from test patterns to determine low-IR-drop preferred values and extract important bit assignments. By applying our techniques, we regenerate test patterns without predicted IR-drop violations. Experimental results show that our test length overhead is only 2.37% on average, and there is no fault coverage loss. Finally, we perform accurate IR-drop simulation on 10 IR-drop-safe patterns and no IR-drop violations are found. | en_US |
dc.relation.ispartof | Proceedings - International Symposium on Quality Electronic Design, ISQED | en_US |
dc.subject | IR-drop | machine learning | test pattern | en_US |
dc.title | Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor | en_US |
dc.type | conference paper | en_US |
dc.identifier.doi | 10.1109/ISQED54688.2022.9806245 | - |
dc.identifier.scopus | 2-s2.0-85133780249 | - |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/85133780249 | - |
dc.relation.journalvolume | 2022-April | en_US |
dc.relation.pageend | 32 | en_US |
item.cerifentitytype | Publications | - |
item.openairetype | conference paper | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | MediaTek-NTU Research Center | - |
crisitem.author.orcid | 0000-0002-4393-5186 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 電機工程學系 |
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