Millimeter-wave VNA Calibration using a CMOS Transmission Line with Distributed Switches
Journal
Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
Journal Volume
2022-June
ISBN
9781665496117
Date Issued
2022-01-01
Author(s)
Abstract
This paper presents a single-element VNA electronic calibration (E-Cal) technique implemented in CMOS technology. The structure employs a transmission line (t-line) loaded with twenty distributed switches whose impedance states can be independently modulated during S-parameter measurements. An algorithm that leverages the implementation concepts from the one-port offset-shorts and the two-port Line-Reflect-Reflect-Match (LRRM) calibrations and takes advantage of the loading periodicity and the structure layout symmetry is developed. The calibration method is justified using a 65-nm CMOS test chip and the measurement results are compared with on-chip one-tier TRL calibration using both passive and active devices up to 67 GHz.
Subjects
CMOS | electronics calibration | impedance modulation | LRRM | offset shorts | single element | VNA
Type
conference paper