https://scholars.lib.ntu.edu.tw/handle/123456789/633637
標題: | Diagnosis of Quantum Circuits in the NISQ Era | 作者: | Li, Yu Min Hsieh, Cheng Yun Li, Yen Wei CHIEN-MO LI |
關鍵字: | fault diagnosis | noisy intermediate-scale quantum | quantum circuit | 公開日期: | 1-一月-2023 | 卷: | 2023-April | 來源出版物: | Proceedings of the IEEE VLSI Test Symposium | 摘要: | Currently, noisy intermediate-scale quantum (NISQ) circuits may not always generate correct outputs due to noise and faults. In this work, we propose a diagnosis technique for NISQ circuits. The proposed technique contains static diagnosis and dynamic diagnosis. Static diagnosis uses a fault dictionary that contains output probability distribution for each fault. Dynamic diagnosis uses binary search to find the accurate fault locations of faulty quantum circuits. We demonstrate our technique using the Qiskit simulator with realistic noise models. We evaluate 15 benchmarks with unitary and non-unitary faults injected. Simulation results show that the average accuracy and resolution are 97.70% and 1.81. Experiments on the IBM Q devices have also been performed, and results show that our technique is feasible on real quantum circuit devices. |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/633637 | ISBN: | 9798350346305 | DOI: | 10.1109/VTS56346.2023.10140030 |
顯示於: | 電機工程學系 |
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