Lensfree on-chip microscopy achieves accurate measurement of yeast cell viability and concentration using machine learning
Journal
2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings
Journal Volume
2017-January
ISBN
9781943580279
Date Issued
2017-10-25
Author(s)
Feizi, Alborz
Zhang, Yibo
Greenbaum, Alon
Guziak, Alex
Luong, Michelle
Chan, Raymond Yan Lok
Berg, Brandon
Ozkan, Haydar
Luo, Wei
Wu, Yichen
Ozcan, Aydogan
Abstract
Automatic measurement of yeast viability and concentration is achieved by coupling a lensfree on-chip holographic microscope with a machine learning based classification algorithm that counts the number of live/dead cells stained with methylene blue.
Type
conference paper