https://scholars.lib.ntu.edu.tw/handle/123456789/64051
標題: | Phase field modeling of excimer laser crystallization of thin silicon films on amorphous substrates | 作者: | Shih, C.J. Fang, C.H. Lu, C.C. Wang, M.H. Lee, M.H. CHUNG-WEN LAN |
公開日期: | 2006 | 期: | 053504 | 起(迄)頁: | - | 來源出版物: | Journal of Applied Physics 100 | 摘要: | Excimer laser crystallization processing of thin silicon films on amorphous silicon oxide substrates was simulated by means of phase field modeling. The quantitative phase field model was derived from the Gibbs-Thompson equation coupled with energy conservation. Because the adaptive mesh scheme was adopted, the present calculations could accommodate both two-dimensional superlateral growth (SLG) phenomena and the realistic interface thickness (in the order of 10-10 m). The vertical growth of fine-grained nucleation structures was simulated using one-dimensional calculations, and the results are consistent with those obtained in previous experiments. Two cases of SLG were also simulated, and the evolution of the interface and thermal fields was determined. Based on our simulation results, we conclude that SLG crystallization does not achieve steady growth because of the extremely fast heat dissipation from the substrate. To obtain very uniform electric characteristics for device fabrication, the layout design and the device position should take the SLG laser mask into consideration. © 2006 American Institute of Physics. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/87462 | DOI: | 10.1063/1.2245193 | SDG/關鍵字: | Amorphous silicon; Crystal growth; Crystallization; Excimer lasers; Heat losses; Interfaces (materials); Silicon; Excimer laser crystallization; Gibbs-Thompson equation; Superlateral growth (SLG); Thin silicon films; Thin films |
顯示於: | 化學工程學系 |
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