The Worst-Case Eye Prediction Algorithm for MIPI C-PHY Signaling on Mobile Artificial Intelligence (AI) Chips
Part Of
IEEE International Symposium on Electromagnetic Compatibility
Start Page
326
End Page
329
ISBN (of the container)
979-835036039-4
Date Issued
2024-08-05
Author(s)
Event(s)
2024 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI
Publisher
IEEE
Type
conference paper