Fault-Detecting Randomized Benchmarking for Testing Quantum Processors
Journal
Proceedings - 2025 IEEE International Test Conference in Asia, ITC-Asia 2025
Start Page
54
End Page
59
ISBN
[9798331571931]
Date Issued
2025-12-16
Author(s)
Abstract
Randomized benchmarking (RB) is widely used in the calibration process of quantum computers with the main focus on average gate fidelity. This work proposes a version with the ability of detecting user-specified faults, and successfully detected faults in simulations and real IBM quantum processors. Our proposal can evaluate error per gate (EPG) and detect faults at the same time. We have shown our FDRB successfully detect axial-tilt fault and rotation fault in both simulation and real experiments. The overhead of our proposal is the quantum native gate count increase depending on the number of faults specified by the user.
Event(s)
9th IEEE International Test Conference in Asia, ITC-Asia 2025
Subjects
fault detection
quantum computing
randomized benchmarking
Publisher
IEEE
Type
conference paper