公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2013 | Test Clock Domain Optimization to Avoid Scan Shift Failures due to Flip-flop Simultaneous Triggering | CHIEN-MO LI ; Y. C. Huang; M. H. Tsai; W. S. Ding; J. C. M. Li; M. T. Chang; M. H. Tsai; C. M. Tseng; H. C. Li; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | |||
2014 | Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk | CHIEN-MO LI ; M. H. Tsai; W. S. Ding; H. Y. Hsieh; CHIEN-MO LI | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | 3 | ||
2012 | Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk, | CHIEN-MO LI ; M. H. Tsai; W. S. Ting; CHIEN-MO LI | ITC |